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Scanning Electron Microscope

Zeiss Neon40 CrossBeam

  • 'Focused ion beam workstation' (FIB)
  • Detektor für energiedispersive Röntgenspektroskopie (EDX)
  • STEM-Detektor
  • Elektronen- und Ionenstrahlithographie

Request for SEM Measurement

Please contact one of the following persons for SEM measurements:

Ruth Bruker, ruth.bruker(at)uni-koeln.de, phone +49-221-4706848
Stefan Roitsch, sroitsch(at)uni-koeln.de, phone +49-221-4704546