zum Inhalt springen

Room: HS 017,  Tel: 0221-470-7742
Contact Person: Selina Olthof

In the recently established Surface Science Laboratory we focus in the investigation of organic semiconductors  regarding their energy levels, the alignment at interfaces to other device relevant materials and their transport properties. In the UHV cluster tool, layers can be prepared in situ using vapor phase deposition. For the energetic characterization we have the methods of UV photoelectron spectroscopy (USP), inverse photoelectron spectroscopy (IPES) and X-ray photoelectron spectroscopy (XPS) available. Further characterization techniques include  Kelvin probe measurements and electrical characterization via IV-measurements.

Measurement tools:

Photoelectron Spectroscopy
UPS / IPES / XPS

  • SPECS, Phoibos 100 hemispherical analyzer with 2D-CCD detector
  • Dual X-ray source (Mg Kα and Al Kα)
  • Monochromatic UV source (HeI and HeII)
  • Kimball electron gun
  • Bandpass photon detector (NaCl / SrF2)
Evaporation chamber
UHV oven
Electrical characterization
Kelvin probe
  • 2 e-beam evaporators for metals
  • 4 thermal sources for organic materials
  • in situ heating up to 400°C
  • Current voltage measurements
  • McAllister KP 6500